S+SSPR 2010, 17-21 August, Cesme, Turkey. (Call for participation)
Joint IAPR International Workshops on
Structural and Syntactic Pattern Recognition (SSPR 2010)
and Statistical Techniques in Pattern Recognition (SPR 2010)
Cesme, Izmir, Turkey, August 18-20, 2010
A satellite event of the 20th International Conference of Pattern Recognition, ICPR 2010.
Sponsored by IAPR and PASCAL2.
The next joint Statistical Pattern Recognition and Structural and Syntactic Pattern Recognition Workshops (organised by TC1 and TC2 of the International Association for Pattern Recognition, (IAPR) will be held at Cesme Altin Yunus Hotel, Cesme, Turkey prior to ICPR 2010 (which itself will be held in Istanbul). The joint workshops aim at promoting interaction and collaboration among researchers working in areas covered by TC1 and TC2. We are also keen to attract participants working in fields that make use of statistical, structural or syntactic pattern recognition techniques (e.g. image processing, computer vision, bioinformatics, chemo-informatics, machine learning, document analysis, etc.). Those working in areas which can make methodological contributions to the field, e.g. methematicians, statisticians, physicists etc, are also very welcome.
The workshop will be held in Cesme, which is a seaside resort on the Aegean coast of Turkey. There area has many interesting attractions including excellent beaches, interesting fishing villages, and nearby archaeological remains and historical sites. These include Cesme castle and the remains of the ancient Greek city of Erythrae. Cesme can be reached by bus from the airport at Izmir, which has good flight connections to Istanbul.
We have a varied programme including invited talks, regular paper and poster sessions, panel sessions and technical committee meetings.
Confirmed Invited Speakers:
Narendra Ahuja (UIUC)
Ernesto Estrada (University of Strathclyde)
Fatih Porikli (Mithshubishi Electric Research Laboratories)
Luc Devroye (McGill University)
SIMILARITY-BASED PATTERN RECOGNITION: CHALLENGES AND PROSPECTS (see below)
Saturday, August 21, 2010
University of York
Middle East Technical University, Ankara
SPR Programme Chair
University of Surrey
SSPR Programme Chair
University of York
University of Alicante
Special Session at S+SSPR 2010
SIMILARITY-BASED PATTERN RECOGNITION: CHALLENGES AND PROSPECTS
Saturday, August 21, 2010
Cesme, Izmir, Turkey
Traditional pattern recognition techniques are centered around the notion of “feature”. According to this view, the objects to be classified are represented in terms of properties that are intrinsic to the object itself. Hence, a typical pattern recognition system makes its decisions by simply looking at one or more feature vectors provided as input. The strength of this approach is that it can leverage a wide range of mathematical tools ranging from statistics, to geometry, to optimization. However, in many real-world applications a feasible feature-based description of objects might be difficult to obtain or inefficient for learning purposes. In these cases, it is often possible to obtain a measure of the (dis)similarity of the objects to be classified, and in some applications the use of dissimilarities (rather than features) makes the problem more viable. In the last few years, researchers in pattern recognition and machine learning are becoming increasingly aware of the importance of similarity information per se. Indeed, by abandoning the realm of vectorial representations one is confronted with the challenging problem of dealing with (dis)similarities that do not necessarily obey the requirements of a metric. This undermines the very foundations of traditional pattern recognition theories and algorithms, and poses totally new theoretical and computational questions.
The SIMBAD project is a EU FP7 project which aims at undertaking a thorough study of several aspects of purely similarity-based pattern analysis and recognition methods, from the theoretical, computational, and applicative perspective. It aims at covering a wide range of problems and perspectives, including supervised and unsupervised learning, generative and discriminative models, and its interest ranges from purely theoretical problems to real-world practical applications.
The SIMBAD consortium is planning to hold a half-day meeting on these topics within the S+SSPR Workshop on the morning of Saturday, 21 August 2010. The meeting will contain the following elements:
a) Presentations from the SIMBAD project about methodologies and philosophies in similarity-based pattern recognition, and the challenges it offers as a subfield in pattern recognition;
b) a panel session involving invited speakers;
c) a session of contributed position papers and poster spotlights.
d) a poster session on specific methods and techniques.
Topics of interest for contributed papers include (but are not limited to):
* Foundational issues
* Embedding and embeddability
* Graph spectra and spectral geometry
* Indefinite and structural kernels
* Characterization of non-(geo)metric behavior
* Measures of (geo)metric violations
* Learning and combining similarities
* Multiple-instance learning
The workshop aims to explore the spectrum of alternative approaches, methodologies and challenges in the area, rather than detailed techniques. Contributions can be of two kinds:
a) position papers that aim to stimulate discussion of the philosophy of approach underpinning the field,
b) individual technical contributions on a focused topic.
We aim to have a 90 minute oral session devoted to the contributed position papers and together with shorter spotlights for the technical papers. There will be an open poster session for technical papers, with an opportunity to present a five minute “spotlight” talk. Since there is no published proceedings, authors should feel free to provide position papers or posters on previously published work.
Prospective particpants should send a one-page abstract to
Marcello Pelillo (pelillo(at)dsi.unive.it)
by 1st June 2010.
We plan to make the videos of the lectures available on VideoLectures.
Joachim M. Buhmann, ETH Zurich, Switzerland
Robert P. W. Duin, Delft University of Technology, The Netherlands
Mario A. T. Figueiredo, Insituto Superior Technico, Lisbon,
Portugal Edwin R. Hancock, University of York, UK
Vittorio Murino, University of Verona, Italy
Marcello Pelillo, Ca’ Foscari University, Venice, Italy (chair)